The increasing number of digital and serial signals has made the complexity of automotive electronics soar, and it is increasingly necessary to use only one instrument to perform digital and analog signal testing.
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The complexity of automotive electronics is increasing with the increasing use of digital circuits and serial signals, and determining an optimal test tool becomes increasingly important. Today, engineers have to process and analyze this hybrid technology signal that includes a combination of digital and analog technologies, which requires the ability to test and analyze digital and analog signals with a single instrument.
1. Test requirements for mixed signals in automotive electronic systems
The complexity of automotive electronics is increasing with the increasing use of digital circuits and serial signals, and determining an optimal test tool becomes increasingly important. Today, engineers have to process and analyze this hybrid technology signal that includes a combination of digital and analog technologies, which requires the ability to test and analyze digital and analog signals with a single instrument.
Traditionally, this mixed signal is usually a separate oscilloscope and logic analyzer, which undoubtedly increases the complexity of the test process, so this approach is not practical. In this regard, Tektronix has introduced a hybrid oscilloscope that can satisfy mixed-signal and serial protocol testing. It can capture and analyze analog and digital signals on one instrument at the same time. More importantly, it can simultaneously analyze digital signals. The time relationship with the analog signal really improves the engineer's test environment and tools, making it easy for engineers to cope with more complex mixed-signal designs.
A typical ECU mixed-signal system is shown below, which contains mixed-signal devices such as AD/DA/MCU.
Figure 1: Basic composition of the ECU
2. Mixed signal test plan and configuration
Tektronix's mixed-signal test solution offers a wide range of options and configurations. The multi-series mixed-signal test platform can meet the needs of different applications and different occasions, making the testing of automotive electronics systems, components, etc. simple, efficient and reliable. And so on. Tektronix's mixed-signal test platform is as follows:
(1) For the test of analog signals, Tektronix can provide superior hardware performance to ensure the detection, capture and analysis of the integrity of analog signals. The main performance specifications are as follows:
Table 1: Platform Performance Specifications
The analog signals displayed are as follows:
Figure 2: Analog signal diagram
(2) For the detection and capture of digital signals, the detection and capture of digital signals must be able to meet the requirements of faster and faster digital signal testing. Tektronix's MagniVu high-speed digital acquisition technology can improve the timing resolution of digital signals to 60.6ps, mixed signals. The digital channel of the test system has the following hardware features:
Table 2: Digital Channel Features of Mixed-Signal Test Systems
Channel independent threshold settings, such a design can easily complete the mixed signal, mixed logic test.
Figure 3: Threshold settings
(3), testing for serial protocols
Tektronix' mixed-signal test platform supports the following standard protocol triggering and decoding analysis.
A: Low-speed serial protocol: I2C, SPI, CAN, LIN, FlexRay, RS-232/422/485/UART, I2S/LJ/RJ/TDM, MIL-STD-1553
B: High speed protocol: LAN, USB, DDR
3. Features and advantages of mixed signals
Tektronix's mixed-signal analysis instrument can solve the problem of simultaneous analysis of multiple types of signals. The typical analysis interface is as follows:
Figure 4: Typical analysis interface
This kind of analysis capability can make the analysis and testing of automotive electronics systems simple and efficient, allowing engineers to get rid of complex instrumentation problems and focus on product development.
Waveform navigation and search functions are available in Tektronix' mixed-signal instruments, which help engineers quickly locate and find the focus of a large amount of information, especially bus analysis.
Figure 5: Analysis of the bus
Waveform search and markup simplifies waveform detail analysis
A: Determine search criteria
(1) Serial packet content
(2) Parallel data
(3) Common trigger combinations
B: Wave Inspector marks each time an event occurs
C: Use the arrow buttons to jump from one event to another
With such a quick tool, you can search the entire waveform data and analyze it at any time.
Therefore, for Tektronix's mixed-signal test platform, the development and testing of domain automotive electronics can reflect the following characteristics:
(1) Advanced hardware platform supports 100MHz-2GHz signal capture
(2) The industry's highest storage length: 20M
(3) Can decode 16/4 (type) bus data at the same time
(4) Wave Inspector automatic search and markup function is convenient and fast
(5) Support decoding and analysis of various standards: CAN/LIN, FlexRay, MOST, etc.
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